Files include the data presented in the manuscript entitled: "Study of the role of a vitreous enamel layer as a primer in copper-to-glass joints" by Domaradzki et al.
Fig. 3 presents results of EDS investigation performed for: (a) bare borosilicate glass 3.3, and (b) coated with vitreous enamel. Measurements were performed using Scanning Electron Microscope (FEI Helios NanoLab 600i SEM) equipped with an Electron Dispersive Spectrometer (Bruker).
Fig. 5a presents EDS spectrum and photo acquired from the top of the deposited droplet with a visible vitreous-glassy fragment on the top of the copper droplet. Measurements were performed using Scanning Electron Microscope (FEI Helios NanoLab 600i SEM) equipped with an Electron Dispersive Spectrometer (Bruker).
Fig. 10 presents results of elemental analysis performed using the LIBS technique with a copper droplet extracted from a bare glass substrate, i.e. elements distribution in the area of a cross-section of the formed Cu-glass joint. Measurements were performed using a Keyence VHX-X1 digital microscope equipped with an EA-300 accessory for elemental analysis.
Fig. 11 presents results of the EDS analysis of the copper-enamel-glass joint formed by melt extrusion deposition of copper on a borosilicate glass plate covered with the vitreous enamel coating. Measurements were performed using Scanning Electron Microscope (FEI Helios NanoLab 600i SEM) equipped with an Electron Dispersive Spectrometer (Bruker).
Fig. 12 presents EDS spectra recorded at 4 locations in the (depth) area of the crater formed after Cu droplet removal. Each spectrum was normalised with respect to the most intense Si peak. Measurements were performed using Scanning Electron Microscope (FEI Helios NanoLab 600i SEM) equipped with an Electron Dispersive Spectrometer (Bruker).
(2026-03-01)
