The files included in the repository contain ellipsometric data collected for a series of polymers as part of the NCN project titled "Intelligent passive materials capable of heating or cooling to temperatures different from the surroundings without additional power supply" (2022/46/E/ST5/00381). The data can be used in user created model, to extract the complex refractive index of polymers.The data were acquired using Woollam ellipsometers, models RC2 and VASE, covering spectral ranges from UV to IR (190–30,000 nm).
The dataset includes results for thin polymer films deposited on a silicon substrate, specifically for the following materials: (iBu)₇Si₇(OH)₃, Et₈T₈, JK21, JK23, MK23, MMG181, MMG193, MMG214, MMG218p, MMG220A, MMG223, MMG231 and Ph₈T₈.The study utilized two types of silicon substrates: single-side polished (SSP) and double-side polished (DSP).
The files in the dataset are named according to the following scheme:
Measurement range_ polymer name_ polymer_ solvent type_ presence of additive_ substrate material_ substrate polishing type_data type
Specifically:
- Measurement range: VIS – visible range, IR – infrared range
- Polymer name – a polymer from the aforementioned list
- Solvent type – in all cases, the solvent is THF
- Presence of an optional additive – the additive is PVA; if this component is absent in the filename, it means the layer does not contain it
- Substrate material – in all cases, the substrate is silicon
- Substrate polishing type: SSP – single-side polished silicon, DSP – double-side polished silicon
- Data type: E contains PSI and delta curves, T- intensity transmission, R- intensity reflection.
The structure of data files is as follows: the first column contains information about the type of data (PSI, Delta, etc.), the second the angle of incidence expressed in degrees. The first row contains information on the wavelength, expressed in nanometres.
