This dataset accompanies the research article “IR- and Raman-active phonon modes in epitaxial boron nitride: a statistical comparison” and contains the full set of raw and processed spectroscopic data used in the study. The research investigates the vibrational properties of epitaxial hexagonal boron nitride (hBN) grown by metalorganic vapour-phase epitaxy (MOVPE), focusing on a direct comparison between the Raman-active E2g phonon mode and the infrared-active E1u mode. Although both modes are widely used to assess crystalline quality, strain, and phonon behavior in hBN, a systematic comparison performed on identical samples has not previously been available. The dataset provides the complete experimental foundation for this comparison.
The measurements include Raman spectra and FTIR transmission spectra collected from fourteen epitaxial BN samples grown under diverse MOVPE conditions. For each sample, Raman spectra were recorded both at the sample surface (BN + sapphire substrate) and with the focus shifted into the substrate to isolate the sapphire contribution. The data processing pipeline follows the methodology described in the publication and supplementary materials: photoluminescence baseline subtraction using polynomial fitting, intensity scaling of the substrate spectrum, subtraction of the scaled substrate signal, and Lorentzian peak fitting of the E2g mode. FTIR spectra were processed through peak fitting to extract the energy and linewidth of the E1u mode. All extracted parameters were averaged using weighted means, with uncertainties determined from internal and external statistical consistency tests. The structure of the dataset is explained in the readme.md file, which is attached to the files of the dataset.
This dataset is intended to support reproducibility, enable independent verification of the reported results, and provide a reference for future studies on phonon behavior in epitaxial hBN. It may be useful for researchers working on two-dimensional materials, nanoscale characterization, phonon engineering, epitaxial growth, and spectroscopic analysis. The data can also serve as a benchmark for cross-technique calibration between Raman and FTIR spectroscopy in layered materials.
(2026-08-25)
