The research involved investigating the optical properties of a free-standing electrochemical metallisation (ECM) memristor structure. The device consists of two active silver electrodes separated by an insulating layer of SiO2. The top and bottom electrodes were approximately 20 nm and 100 nm thick, respectively, while the switching layer was around 186 nm thick. The structure was found to simultaneously provide wavelength-dependent multi-level non-volatile optical storage, volatile light modulation, and dynamic polarisation control.
Here, we present the raw optical data collected using a varying angle spectral ellipsometer (RC2, manufactured by J.A. Woollam Co.). The data pertain to three samples (pixels) subjected to different electrical stimulations. The first sample (PositiveVoltageSample) was exposed to only positive voltage, the second sample (NegativeVoltageSample) to only negative voltage, and the third sample (PositiveNegativeVoltageSample) to both positive and negative voltages.
For each stimulation scenario, there are three types of associated files. The first two types contain information about the ellipsometric data (PSI, PSI error, Delta, Delta error, depolarisation, and intensity as a function of incident angle and wavelength) either before (BeforeModulation) or after (AfterModulation) the electrical stimulation. The third type contains information about the time dependence of ellipsometric data during the electrical stimulation (InsituModulation). Due to the large amount of information in this case, the ellipsometric data has been written into several files, each dedicated to either PSI, Delta, or Intensity.
For information on the structure and contents of each file, please refer to the readme.txt file.
