Files include the data obtained in the experimental study of a zeolite coating on zirconia.
Data (.tif) includes:
SEM_Cross_section_1kx - SEM images were taken at 1000x magnification. The VEGA3 scanning electron microscope (Tescan, Czech Republic) was utilized to analyze the morphology of the fabricated material.
SEM_Zr_2kx - SEM images were taken at 2000x magnification. The VEGA3 scanning electron microscope (Tescan, Czech Republic) was utilized to analyze the morphology of the fabricated material.
SEM_Zr_10kx - SEM images were taken at 10000x magnification. The VEGA3 scanning electron microscope (Tescan, Czech Republic) was utilized to analyze the morphology of the fabricated material.
SEM_ZrZeo_Ca_2kx - SEM images were taken at 2000x magnification. The VEGA3 scanning electron microscope (Tescan, Czech Republic) was utilized to analyze the morphology of the fabricated material.
SEM_ZrZeo_Ca_10kx - SEM images were taken at 10000x magnification. The VEGA3 scanning electron microscope (Tescan, Czech Republic) was utilized to analyze the morphology of the fabricated material.
SEM_ZrZeo_Ca_Mino_2kx - SEM images were taken at 2000x magnification. The VEGA3 scanning electron microscope (Tescan, Czech Republic) was utilized to analyze the morphology of the fabricated material.
SEM_ZrZeo_Ca_MINO_10kx - SEM images were taken at 10000x magnification. The VEGA3 scanning electron microscope (Tescan, Czech Republic) was utilized to analyze the morphology of the fabricated material.
SEM_ZrZeo_Mg_2kx - SEM images were taken at 2000x magnification. The VEGA3 scanning electron microscope (Tescan, Czech Republic) was utilized to analyze the morphology of the fabricated material.
SEM_ZrZeo_Mg_10kx - SEM images were taken at 10000x magnification. The VEGA3 scanning electron microscope (Tescan, Czech Republic) was utilized to analyze the morphology of the fabricated material.
SEM_ZrZeo_Mg_MINO_2kx - SEM images were taken at 2000x magnification. The VEGA3 scanning electron microscope (Tescan, Czech Republic) was utilized to analyze the morphology of the fabricated material.
SEM_ZrZeo_Mg_MINO_10kx - SEM images were taken at 10000x magnification. The VEGA3 scanning electron microscope (Tescan, Czech Republic) was utilized to analyze the morphology of the fabricated material.
SEM_ZrZeo_Na_2kx - SEM images were taken at 2000x magnification. The VEGA3 scanning electron microscope (Tescan, Czech Republic) was utilized to analyze the morphology of the fabricated material.
SEM_ZrZeo_Na_10kx - SEM images were taken at 10000x magnification. The VEGA3 scanning electron microscope (Tescan, Czech Republic) was utilized to analyze the morphology of the fabricated material.
SEM_ZrZeo_Sr_2kx - SEM images were taken at 2000x magnification. The VEGA3 scanning electron microscope (Tescan, Czech Republic) was utilized to analyze the morphology of the fabricated material.
SEM_ZrZeo_Sr_10kx - SEM images were taken at 10000x magnification. The VEGA3 scanning electron microscope (Tescan, Czech Republic) was utilized to analyze the morphology of the fabricated material.
SEM_ZrZeo_Sr_MINO_2kx - SEM images were taken at 2000x magnification. The VEGA3 scanning electron microscope (Tescan, Czech Republic) was utilized to analyze the morphology of the fabricated material.
SEM_ZrZeo_Sr_MINO_10kx - SEM images were taken at 10000x magnification. The VEGA3 scanning electron microscope (Tescan, Czech Republic) was utilized to analyze the morphology of the fabricated material.
2D_topography_images_Zr - The topography was determined using a profilometer.
2D_topography_images_ZrZeo_Ca - The topography was determined using a profilometer.
2D_topography_images_ZrZeo_Mg - The topography was determined using a profilometer.
2D_topography_images_ZrZeo_Mg_MINO - The topography was determined using a profilometer.
2D_topography_images_ZrZeo_Na - The topography was determined using a profilometer.
2D_topography_images_ZrZeo_Sr_MINO - The topography was determined using a profilometer.
2D_topography_images_ZrZeo-Ca_MINO - The topography was determined using a profilometer.
2D_topography_images_ZrZro_Sr - The topography was determined using a profilometer.
Data (.jpg) includes:
FT-IR_mapping_Zr - Mapping of the band within the range shown in the image was performed using a LUMOS II FTIR microscope.
FT-IR_mapping_ZrZeo_Ca - Mapping of the band within the range shown in the image was performed using a LUMOS II FTIR microscope.
FT-IR_mapping_ZrZeo_Ca_MINO - Mapping of the band within the range shown in the image was performed using a LUMOS II FTIR microscope.
FT-IR_mapping_ZrZeo_Mg - Mapping of the band within the range shown in the image was performed using a LUMOS II FTIR microscope.
FT-IR_mapping_ZrZeo_Mg_MINO - Mapping of the band within the range shown in the image was performed using a LUMOS II FTIR microscope.
FT-IR_mapping_ZrZeo_Na - Mapping of the band within the range shown in the image was performed using a LUMOS II FTIR microscope.
FT-IR_mapping_ZrZeo_Sr - Mapping of the band within the range shown in the image was performed using a LUMOS II FTIR microscope.
FT-IR_mapping_ZrZeo_Sr_MINO - Mapping of the band within the range shown in the image was performed using a LUMOS II FTIR microscope.
Data (.csv) includes:
FT_IR_spectra_of_the_prepared_materials - FT-IR spectra were recorded to identify the characteristic functional groups and chemical bonds present in the prepared materials.
XRD - XRD analysis was performed to determine the crystalline phases and structural characteristics of the prepared materials.
List of abbreviations:
SEM – scanning electron microscopy;
FTIR – Fourier-transform infrared spectroscopy; Fourier-transform infrared spectroscopy;
ZrZeo – zirconium modified with zeolite;
MINO – minodronate.
